TY  - RPRT
TI  - Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis
AU  - Heather Lowers
AU  - Gregory P. Meeker
AU  - Isabelle K. Brownfield
PY  - 2005
DO  - 10.3133/ofr20051073
UR  - https://pubs.usgs.gov/publication/ofr20051073
ID  - ofr20051073
ER  -