TY  - RPRT
TI  - Measurement of illite particle thickness using a direct Fourier transform of small-angle X-ray scattering data
AU  - Chao Shang
AU  - James A. Rice
AU  - Dennis D. Eberl
AU  - Jar-Shyong Lin
PY  - 2024
DO  - 10.1346/ccmn.2003.0510305
UR  - https://pubs.usgs.gov/publication/70025675
ID  - 70025675
ER  -