TY  - RPRT
TI  - Nano-metrology and terrain modelling - convergent practice in surface characterisation
AU  - R.J. Pike
PY  - 2000
DO  - 10.1016/s0301-679x(00)00075-x
UR  - https://pubs.usgs.gov/publication/70022338
ID  - 70022338
ER  -