TY  - RPRT
TI  - XRD measurement of mean thickness, thickness distribution and strain for illite and illite-smectite crystallites by the Bertaut-Warren-Averbach technique
AU  - Victor A. Drits
AU  - Dennis D. Eberl
AU  - Jan Srodon
PY  - 2024
DO  - 10.1346/ccmn.1998.0460105
UR  - https://pubs.usgs.gov/publication/70020450
ID  - 70020450
ER  -