@misc{indiciae75e02efe0ad7,
  title = {XRD measurement of mean thickness, thickness distribution and strain for illite and illite-smectite crystallites by the Bertaut-Warren-Averbach technique},
  author = {Victor A. Drits and Dennis D. Eberl and Jan Srodon},
  year = {2024},
  doi = {10.1346/ccmn.1998.0460105},
  url = {https://pubs.usgs.gov/publication/70020450},
  note = {Source identifier: 70020450}
}